Simultaneous atomic imaging of atomic force microscopy and scanning tunneling microscopy using metal coated cantilevers

Materials Transactions

Volumn 50, Issue 5, 2009, Pages 940-942

  Sawada, Daisuke ^a   Hirai, Akira ^a   Sugimoto, Yoshiaki ^a   Abe, Masayuki ^a,b   Morita, Seizo ^a  

^a OSAKA UNIVERSITY   (Japan)

^b JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

Author keywords

Atomic force microscopy; Frequency modulation; Ge(111); Scanning tunneling microscopy; Si(111); TiO2

Indexed keywords

ATOMIC IMAGING; ATOMIC PATTERNS; GE(111); HIGH SPATIAL RESOLUTION IMAGES; METAL-COATED; NONCONTACT ATOMIC FORCE MICROSCOPY; ROOM TEMPERATURE; SCANNING TUNNELING MICROSCOPY (STM); SI(111); SIMULTANEOUS MEASUREMENT; SURFACE ATOMS; TIO; TIO2;

ATOMS; FREQUENCY MODULATION; GERMANIUM; NANOCANTILEVERS; SCANNING; SCANNING TUNNELING MICROSCOPY; SILICON; WIND TUNNELS;

ATOMIC FORCE MICROSCOPY;

EID: 67650484269     PISSN: 13459678     EISSN: None     Source Type: Journal    
DOI: 10.2320/matertrans.MC200818     Document Type: Conference Paper

References (23)

1. S. Morita, R. Wiesendanger and E. Meyer: Noncontact Atomic Force Microscopy (Berlin, Springer, 2002).
2. Y. Sugimoto, P. Pou, O. Custance, P. Jelinek, S. Morita, R. Pérez and M. Abe: Phys. Rev. B 73 (2006) 205329.
3. P. Güthner: J. Vac. Sci. Technol. B 4 (1996) 2428.
4. T. Arai and M. Tomitori: Phys. Rev. Lett. 93 (2004) 256101.
5. G. H. Enevoldsen, H. P. Pinto, A. S. Foster, M. C. R. Jensen, A. Kühnle, M. Reichling, W. A. Hofer, J. V. Lauritsen and F. Besenbacher: Phys. Rev. B 78 (2008) 045416.
6. A. Oral, R. A. Grimble, H. O. Özer, P. M. Hoffmann and J. B. Pethica: Appl. Phys. Lett. 79 (2001) 1915.
7. S. Hembacher, F. J. Giessibl, J. Mannhart and C. F. Quate: Proc. Natl. Acad. Sci. 100 (2003) 12539.
8. M. Ternes, C. P. Luts, C. F. Hirjibehedin, F. J. Giessibl and A. J. Heinrich: Science 319 (2008) 1066.
9. M. Abe, Y. Sugimoto and S. Morita: Nanotechnol. 16 (2005) S68.
10. R. S. Becker, B. S. Swartzentruber, J. S. Vickers and T. Klitsner: Phys. Rev. B 39 (1989) 1633.
11. E. S. Hirschorn, D. S. Lin, F. M. Leibsle, A. Samsavar and T.-C. Chiang: Phys. Rev. B 44 (1991) 1403.
12. P. Molin'as-Mata and J. Zegenhagen: Phys. Rev. B 47 (1993) 10319.
13. G. Lee, H. Mai, I. Chizhov and R. F. Willis: J. Vac. Sci. Technol. A 16 (1998) 1006.
14. G. H. Enevoldesen, A. S. Foster, M. C. Christensen, J. V. Lauritsen and F. Besenbacher: Phys. Rev. B 76 (2007) 205415.
15. M. Abe, Y. Sugimoto, O. Custance and S. Morita: Appl. Phys. Lett. 87 (2005) 173503.
16. M. Abe, Y. Sugimoto, O. Custance and S. Morita: Nanotechnol. 16 (2005) 3029.
17. M. Abe, Y. Sugimoto, T. Namikawa, K. Morita, N. Oyabu and S. Morita: Appl. Phys. Lett. 90 (2007) 203103.
18. Y. Sugimoto, M. Abe, S. Hirayama, N. Oyabu, O. Custance and S. Morita: Nature Mater. 4 (2005) 156.
19. Y. Sugimoto, P. Jelinek, P. Pou, M. Abe, S. Morita, R. Perez and O. Custance: Phys. Rev. Lett. 98 (2007) 106104.
20. Y. Sugimoto, P. Pou, O. Custance, P. Jelinek, M. Abe, R. Perez and S. Morita: Science 322 (2008) 413.
21. Y. Sugimoto, P. Pou, M. Abe, P. Jelinek, R. Perez, S. Morita and O. Custance: Nature (London) 446 (2007) 64.
22. Y. Sugimoto, T. Namikawa, K. Miki, M. Abe and S. Morita: Phys. Rev. B 77 (2008) 195424.
23. D. Sawada, Y. Sugimoto, M. Abe and S. Morita: in preparation.