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Volumn 49, Issue 5 PART 2, 2010, Pages
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Improvements of indium tin oxide film deposited on poly(ethylene terephthalate) substrates by plasma-polymerized hydrogenated silicon-carbon-oxide buffer layer
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Author keywords
[No Author keywords available]
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Indexed keywords
CRITICAL RADIUS;
CURVATURE RADII;
DYNAMIC BENDING TEST;
ELECTRICAL RESISTIVITY;
HYDROGENATED SILICON;
INDIUM TIN OXIDE FILMS;
ITO FILMS;
OPTICAL TRANSMISSIONS;
OXIDE BUFFER LAYERS;
POLY(ETHYLENE TEREPHTHALATE) SUBSTRATE;
STATIC AND DYNAMIC;
STATIC BENDING TESTS;
BUFFER LAYERS;
CARBON FILMS;
DURABILITY;
ELECTRIC CONDUCTIVITY;
ETHYLENE;
HYDROGENATION;
INDIUM;
LIGHT TRANSMISSION;
OXIDE FILMS;
PHOTOLITHOGRAPHY;
POLYETHYLENE TEREPHTHALATES;
SILICON;
TIN;
TITANIUM COMPOUNDS;
ITO GLASS;
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EID: 77952969142
PISSN: 00214922
EISSN: 13474065
Source Type: Journal
DOI: 10.1143/JJAP.49.05EA07 Document Type: Article |
Times cited : (5)
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References (26)
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