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Volumn 46, Issue 4, 2000, Pages 519-531
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Characterization of the topography and surface potential of electrodeposited conducting polymer films using atomic force and electric force microscopies
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Author keywords
[No Author keywords available]
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
CONDUCTIVE FILMS;
DOPING (ADDITIVES);
ELECTROPOLYMERIZATION;
GRAIN SIZE AND SHAPE;
MORPHOLOGY;
PLASTIC FILMS;
POLYPYRROLES;
POTENTIAL ENERGY;
ELECTRIC FORCE MICROSCOPY (EFM);
SURFACE POTENTIAL DISTRIBUTIONS;
ELECTRODEPOSITION;
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EID: 0034503760
PISSN: 00134686
EISSN: None
Source Type: Journal
DOI: 10.1016/S0013-4686(00)00627-7 Document Type: Article |
Times cited : (67)
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References (31)
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