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Volumn 96, Issue 18, 2010, Pages

Investigation of E1 (LO) phonon-plasmon coupled modes and critical points in In1-x Gax N thin films by optical reflectance measurements

(7) Thakur, J S a Dixit, A a Danylyuk, Y V b Sudakar, C a Naik, V M c Schaff, W J d Naik, R a

a WAYNE STATE UNIVERSITY (United States)

b Wayne State University (United States)

c UNIVERSITY OF MICHIGAN DEARBORN (United States)

d Cornell University (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BAND GAP ENERGY; COUPLED MODE; CRITICAL POINTS; HIGH ENERGY; INFRARED REFLECTANCE; LOW ENERGIES; OPTICAL MODES; OPTICAL REFLECTANCE; PHONON-PLASMON COUPLED MODE; UV-VISIBLE; WAVE VECTOR;

CRYSTAL GROWTH; EQUATIONS OF STATE; GALLIUM; MOLECULAR BEAM EPITAXY; MOLECULAR BEAMS; PLASMONS; REFLECTION; REFLECTOMETERS; THIN FILMS;

OPTICAL FILMS;

EID: 77952826680 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.3428368 Document Type: Article

Times cited : (6)

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