Phase separation and optical properties in oxygen-rich InN films

Applied Physics Letters

Volumn 93, Issue 14, 2008, Pages

  Dixit, A ^a   Sudakar, C ^a   Naik, R ^a   Lawes, G ^a   Thakur, J S ^a,b   McCullen, E F ^b   Auner, G W ^b   Naik, V M ^c  

^a WAYNE STATE UNIVERSITY   (United States)

^b Wayne State University   (United States)

^c UNIVERSITY OF MICHIGAN DEARBORN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

INN FILMS; INN THIN FILMS; OPTICAL-;

OPTICAL PROPERTIES; OXYGEN; SEPARATION; THICK FILMS;

PHASE SEPARATION;

EID: 53649100748     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2963498     Document Type: Article

References (26)

1. A. G. Bhuiyan, A. Hashimoto, and A. Yamamoto, J. Appl. Phys. 94, 2779 (2003).
2. S. Nakamura, M. Senoh, S. Nagahama, N. Iwasa, T. Yamada, T. Matsushita, H. Kiyoku, and Y. Sugimoto, Jpn. J. Appl. Phys., Part 2 35, L74 (1996).
3. J. S. Thakur, Y. V. Danylyuk, D. Haddad, V. M. Naik, R. Naik, and G. W. Auner, Phys. Rev. B 76, 035309 (2007).
4. J. S. Thakur, R. Naik, V. M. Naik, D. Haddad, G. W. Auner, H. Lu, and W. J. Schaff, J. Appl. Phys. 99, 023504 (2006).
5. I. Shalish, Y. Shapira, L. Burstein, and J. Salzman, J. Appl. Phys. 89, 390 (2001).
6. M. D. McCluskey, N. M. Johnson, C. G. Van de Walle, D. P. Bour, M. Kneissl, and W. Walukiewics, Phys. Rev. Lett. 80, 4008 (1998).
7. K. L. Westra, R. P. W. Lawson, and M. J. Brett, J. Vac. Sci. Technol. A 6, 1730 (1988).
8. V. Y. Davydov, A. A. Klochikhin, R. P. Seisyan, V. V. Emptsev, S. V. Ivanov, F. Bechstedt, J. Furthmuller, H. Harima, A. V. Mudryi, J. Aderhold, O. Semchinova, and J. Garul, Phys. Status Solidi B 229, R1 (2002).
9. J. Wu, W. Walukiewicz, K. M. Yu, J. W. Ager III, E. E. Haller, H. Lu, W. J. Schaff, Y. Saito, and Y. Nanishi, Appl. Phys. Lett. 80, 3967 (2002).
10. E. Kurimoto, M. Hangyo, H. Harima, M. Yoshimoto, T. Yamaguchi, T. Araki, and Y. Nannishi, Appl. Phys. Lett. 84, 212 (2004).
11. V. Yu. Davydov, A. A. Klochikhin, V. V. Emtsev, D. A. Kurdyukov, S. V. Ivanov, V. A. Vekshin, F. Bechstedt, J. Furthmuller, J. Aderhold, J. Graul, A. V. Mudryi, H. Harima, A. Hashimoto, A. Yamamoto, and E. E. Haller, Phys. Status Solidi B 234, 787 (2002).
12. See EPAPS Document No. E-APPLAB-93-040830 for additional SEM and TEM images of the samples. For more information on EPAPS, see http://www.aip.org/ pubservs/epaps.html.
13. K. S. A. Butcher and T. L. Tansley, Superlattices Microstruct. 38, 1 (2005).
14. Q. X. Guo, M. Nishio, H. Ogawa, A. Wakahara, and A. Yoshida, Phys. Rev. B 58, 15304 (1998).
15. L. F. J. Piper, T. D. Veal, M. Walker, I. Mahboob, C. F. McConville, H. Lu, and W. J. Schaff, J. Vac. Sci. Technol. A 23, 617 (2005).
16. M. Faur, M. Faur, D. T. Jayne, M. Goradia, and C. Goradia, Surf. Interface Anal. 15, 641 (1990).
17. K. S. A. Butcher, A. J. Fernandes, P. P. T. Chen, M. Wintrebert-Fouquet, H. Timmers, S. K. Shrestha, H. Hirshy, R. M. Perks, and B. F. Usher, J. Appl. Phys. 101, 123702 (2007).
18. L. Cao, Z. L. Xie, B. Liu, X. Q. Xiu, R. Zhang, and Y. D. Zheng, J. Vac. Sci. Technol. B 25, 199 (2007).
19. M. Rojas-López, J. Nieto-Navarro, E. Rosendo, H. Navarro-Contreras, and M. A. Vidal, Thin Solid Films 379, 1 (2000).
20. C. Vigreux, L. Binet, and D. Gourier, J. Solid State Chem. 157, 94 (2001).
21. W. B. White and V. G. Keramidas, Spectrochim. Acta, Part A 28, 501 (1972).
22. A. Prim, E. Pellicer, E. Rossinyol, F. Peiró, A. Cornet, and J. R. Morante, Adv. Funct. Mater. 17, 2957 (2007).
23. I. Hamberg and C. G. Granqvist, J. Appl. Phys. 60, R123 (1986).
24. J. S. Thakur, G. W. Auner, D. B. Haddad, R. Naik, and V. M. Naik, J. Appl. Phys. 95, 4795 (2004).
25. A. Kasic, M. Schubert, Y. Saito, Y. Nanishi, and G. Wanger, Phys. Rev. B 65, 115206 (2002).
26. S. Rumyantsev, M. Shur, and M. Levinshtein, Int. J. High Speed Electron. Syst. 14, 1 (2004).