Analysis of surface-plasmon-polaritons-assisted interference imaging by using silver film with rough surface

Optics Express

Volumn 18, Issue 10, 2010, Pages 10685-10693

  Shi, Sha ^a   Zhang, Zhiyou ^a   He, Mingyang ^a   Li, Xupeng ^a   Yang, Jing ^b   Du, Jinglei ^a  

^a SICHUAN UNIVERSITY   (China)

^b ZHENGZHOU UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

FINITE DIFFERENCE TIME DOMAIN METHOD; METALLIC FILMS; OPTICAL TRANSFER FUNCTION; PHONONS; PHOTONS; PLASMONS; QUANTUM THEORY; SOLIDS; SURFACE MEASUREMENT; SURFACE PLASMON RESONANCE;

EXPERIMENTAL PARAMETERS; IMAGING QUALITY; INFORMATION TRANSMISSION; INTERFERENCE IMAGING; INTERFERENCE LITHOGRAPHY; LIGHT FIELDS; NANO SCALE; NEAR-FIELD; ROUGH SURFACES; SCATTERED LIGHT; SCATTERING EFFECTS; SILVER FILM; SURFACE PLASMON POLARITONS; UPPER SURFACE;

SILVER;

SILVER;

ARTICLE; CHEMICAL MODEL; CHEMISTRY; COMPUTER SIMULATION; LIGHT; METHODOLOGY; RADIATION SCATTERING; REFRACTOMETRY; SURFACE PLASMON RESONANCE; SURFACE PROPERTY;

COMPUTER SIMULATION; LIGHT; MODELS, CHEMICAL; REFRACTOMETRY; SCATTERING, RADIATION; SILVER; SURFACE PLASMON RESONANCE; SURFACE PROPERTIES;

EID: 77952696397     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.18.010685     Document Type: Article

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