Experimental studies of far-field superlens for sub-diffractional optical imaging

Optics Express

Volumn 15, Issue 11, 2007, Pages 6947-6954

  Liu, Zhaowei ^a   Durant, Stéphane ^a,b   Lee, Hyesog ^a   Pikus, Yuri ^a   Xiong, Yi ^a   Sun, Cheng ^a   Zhang, Xiang ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b KLA TENCOR CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROMAGNETIC WAVE DIFFRACTION; IMAGE RECONSTRUCTION; IMAGE RESOLUTION; IMAGING SYSTEMS; OPTICAL DESIGN; WAVELENGTH;

FAR FIELD SUPERLENS (FSL); PROPAGATING FIELDS; SUBWAVELENGTH RESOLUTION; SUPERLENS;

LENSES;

EID: 34249676362     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.15.006947     Document Type: Article

References (34)

1. M. Born, and E. Wolf, Principles of Optics (Pergamon Press, Fourth edition 1970).
2. E. Betzig, J. K. Trautman, T. D. Harris, J. S. Weiner, and R. K. Kostelak, "Breaking the diffraction barrier: optical microscopy on a nanometric scale," Science 251, 1468-1470 (1991).
3. D. Courjon, Near-field microscopy and near-field optics (London, Imperial College Press, 2003).
4. S. W. Hell and J. Wichmann, "Breaking the diffraction resolution limit by stimulated emission: stimulated emission deletion microscopy," Opt. Lett. 19, 780-782 (1994).
5. S. W. Hell, "Toward fluorescence nanoscopy," Nat. Biotechnol. 21, 1347-1355 (2003).
6. R. Heintzmann, T. M. Jovin, and C. Cremer, "Saturated patterned excitation microscopy-a concept for optical resolution improvement," J. Opt. Soc. Am. A19, 1599-1609 (2002).
7. M. G. L. Gustafsson, "Nonlinear structured-illumination microscopy: Wide-field fluorescence imaging with theoretically unlimited resolution," PNAS 102, 13081-13086 (2005).
8. M. J. Rust, M. Bates, and X. W. Zhuang, "Sub-diffraction-limit imaging by stochastic optical reconstruction microscopy (STORM)," Nature Method 3, 793-795 (2006).
9. E. Betzig, G. H. Patterson, R. Sougrat, O. W. Lindwasser, S. Olenych, J. S. Bonifacino, M. W. Davidson, J. Lippincott-Schwartz, and H. F. Hess, "Imaging intracellular fluorescent proteins at nanometer resolution," Science 313, 1642-1645 (2006).
10. J. Gelles, B. J. Schnapp, and M. P. Sheetz, "Tracking kinesin-driven movements with nanometer-scale precision," Nature 331, 450-453 (1988).
11. A. Yildiz, J. N. Forkey, S. A. Mckinney, T. Ha, Y. E. Goldman, P. R. Selvin, "Myosin V walks hand-over-hand: Single fluorophore imaging with 1.5-nm localization," Science 300, 2061-2065 (2003).
12. J. B. Pendry, "Negative refraction makes a perfect lens," Phys. Rev. Lett. 85, 3966-3969 (2000).
13. C. G. Parazzoli, R. B. Greegor, K. Li, B. E. C. Koltenbah, M. Tanielian, "Experimental verification and simulation of negative index of refraction using Snell's law," Phys. Rev. Lett. 90, 107401 (2003).
14. A. A. Houck, J. B. Brock, and I. L. Chuang, "Experimental observations of a left-Handed material that obeys Snell's law," Phys. Rev. Lett. 90, 137401 (2003).
15. A. Grbic and G. V. Eleftheriades, "Overcoming the diffraction limit with a planar left-handed transmission-line lens," Phys. Rev. Lett. 92, 117403 (2004).
16. W. Cai, D. A. Genov, and V. M. Shalaev, "A superlens based on metal-dielectric composites," Phys. Rev. B 72, 193101 (2005).
17. C. Luo, S. G. Johnson, J. D. Joannopoulos, and J. B. Pendry, "Subwavelength imaging in photonic crystals," Phys. Rev. B 68, 045115 (2003).
18. V. P. Parimi, W. T. Lu, P. Vodo, and S. Sridhar, "Photonic crystals - imaging by flat lens using negative retraction," Nature 426, 404-404 (2003).
19. E. Cubukcu, K. Aydin, E. Ozbay, S. Foteinopou, C. M. Soukoulis, "Subwavelength resolution in a two-dimensional photonic-crystal-based superlens," Phys. Rev. Lett. 91, 207401 (2003).
20. N. Fang, H. Lee, C. Sun, and X. Zhang, "Sub-diffraction-limited optical imaging with a silver superlens," Science 308, 534-537 (2005).
21. H. Lee, Y. Xiong, N. Fang, W. Srituravanich, S. Durant, M. Ambati, C. Sun, and X. Zhang, "Realization of optical superlens imaging below the diffraction limit," New J. Phys. 7, 255, (2005).
22. T. Taubner, D. Korobkin, Y. Urzhumov, G. Shvets, R. Hillenbrand, "Near-field microscopy through a SiC superlens," Science 313, 1595 (2006).
23. V. A. Podolskiy and E. E. Narimanov, "Near-sighted superlens," Opt. Lett. 30, 75-77 (2005).
24. S. Durant, Z. Liu, N. Fang, and X. Zhang, www.arxiv.org, physics/0601163, 2006; S. Durant, Z. Liu, J. M. Steele, and X. Zhang, "Theory of the transmission properties of an optical far-field superlens for imaging beyond the diffraction limit," J. Opt. Soc. Am. B 23, 2383-2392 (2006).
25. Z. Liu, S. Durant, H. Lee, Y. Pikus, Y. Xiong, C. Sun, and X. Zhang, X., "Far-field optical superlens," Nano. Lett. 7, 403-408 (2007).
26. Z. Jacob, L. V. Alekseyev, and E. Narimanov, "Optical hyperlens: Far-field imaging beyond the diffraction limit," Opt. Express 14, 8247-8256 (2006).
27. A. Salandrino and N. Engheta, "Far-field subdiffraction optical microscopy using metamaterial crystals: Theory and simulations," Phy. Rev. B 74, 075103 (2006).
28. Z. Liu, H. Lee, Y. Xiong, C. Sun, and X. Zhang, "Optical hyperlens magnifying sub-diffraction-limitted object," Science 315, 1686 (2007).
29. Z. Liu, S. Durant, H. Lee, Y. Xiong, Y. Pikus, C. Sun, and X. Zhang, "Near-field Moire effect mediated by surface plasmon polariton excitation," Opt. Lett. 32, 629-631 (2007).
30. M. G. L. Gustafsson, "Surpassing the lateral resolution limit by a factor of two using structured illumination microscopy," J. Microsc.-Oxf 198, 82-87 (2000).
31. J. T. Frohn, H. F. Knapp, and A. Stemmer, "True optical resolution beyond the Rayleigh limit achieved by standing wave illumination," PNAS 97, 7232-7236 (2000).
32. V. Krishnamurthi, B. Bailey, and F. Lanni, "Image processing in 3-D standing-wave fluorescence microscopy," Proc. SPIE Int. Soc. Opt. Eng. 2655, 18 (1996).
33. M. A. Grimm and A. W. Lohmann, "Superresolution image for one-dimensional objects," J. Opt. Soc. Am. 56, 1151-1156 (1966).
34. M. G. Moharam, E. B. Grann, D. A. Pommet, and T. K. Gaylord, "Formulation for stable and efficient implementation of the rigorous coupled-wave analysis of binary gratings," J. Opt. Soc. Am. A 12, 1068-1076 (1995).