Super-resolution imaging through a planar silver layer

Optics Express

Volumn 13, Issue 6, 2005, Pages 2127-2134

  Melville, David O S ^a   Blaikie, Richard J ^a  

^a UNIVERSITY OF CANTERBURY   (New Zealand)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; DIELECTRIC DEVICES; FINITE DIFFERENCE METHOD; FREQUENCIES; IMAGE PROCESSING; LENSES; PHOTOLITHOGRAPHY; PLASMA APPLICATIONS; TUNGSTEN;

PLANAR SILVER LAYER; PLASMA FREQUENCY; SUPER-RESOLUTION IMAGING;

SILVER;

EID: 17444418334     PISSN: 10944087     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OPEX.13.002127     Document Type: Article

References (8)

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