Applications of imaging techniques for solar cell characterization

Conference Record of the IEEE Photovoltaic Specialists Conference

Volumn , Issue , 2009, Pages 000276-000281

  Johnston, Steven W ^a   Call, Nathan J ^a,b   Phan, Bill ^c   Ahrenkiel, Richard K ^b,c  

^a NATIONAL RENEWABLE ENERGY LABORATORY   (United States)

^b Department of Geology and Geological Engineering   (United States)

^c CaliSolar   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CELL PERFORMANCE; DIFFUSION LENGTH; ELECTROLUMINESCENCE IMAGING; IMAGING DATA; LIFETIME MAPPING; LOCKIN THERMOGRAPHY; MATERIAL QUALITY; MICROWAVE REFLECTION; MINORITY CARRIER LIFETIMES; MULTICRYSTALLINE SI; PHOTOLUMINESCENCE IMAGING; POINT MEASUREMENT; QUANTITATIVE DATA; RESEARCH TOOLS; SOLAR CELL CHARACTERIZATION;

CARRIER LIFETIME; ELECTRIC RESISTANCE; IMAGING TECHNIQUES; REMOTE SENSING; SEMICONDUCTING SILICON COMPOUNDS; SILICON WAFERS;

THERMOGRAPHY (IMAGING);

EID: 77951603482     PISSN: 01608371     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/PVSC.2009.5411681     Document Type: Conference Paper

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