Shunts due to laser scribing of solar cells evaluated by highly sensitive lock-in thermography

Solar Energy Materials and Solar Cells

Volumn 65, Issue 1, 2001, Pages 55-62

  Breitenstein, O ^a   Langenkamp, M ^a   Lang, O ^b   Schirrmacher, A ^c  

^a MAX PLANCK INSTITUTE OF MICROSTRUCTURE PHYSICS   (Germany)

^b SOLARC   (Germany)

^c Laser und Medizin Technologie GmbH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

DIGITAL SIGNAL PROCESSING; LASER BEAM CUTTING; LEAKAGE CURRENTS; PERSONAL COMPUTERS; TEMPERATURE INDICATING CAMERAS; THERMOGRAPHY (TEMPERATURE MEASUREMENT);

FOCAL PLANE ARRAY; NOISE EQUIVALENT TEMPERATURE DIFFERENCE; THERMOCAMERA;

SILICON SOLAR CELLS;

EID: 0035194612     PISSN: 09270248     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0927-0248(00)00077-5     Document Type: Article

References (3)

1. Busse G., Wu D., Karpen W. Thermal wave imaging with phase sensitive modulated thermography. J. Appl. Phys. 71:1992;3962-3965.
2. Breitenstein O., Langenkamp M. Lock-in contact thermography investigation of lateral electronic inhomogeneities in semiconductor devices. Sensors and Actuators A. 71:1998;46-50.
3. O. Breitenstein, J. Heydenreich, Non-ideal I-V-characteristics of block-cast silicon solar cells, Solid State Phenomena, Vols. 37-38 (1994) 139-144.