Inspection of refractive x-ray lenses using high-resolution differential phase contrast imaging with a microfocus x-ray source

Review of Scientific Instruments

Volumn 78, Issue 9, 2007, Pages

  Engelhardt, Martin ^a,b   Baumann, Joachim ^a   Schuster, Manfred ^a   Kottler, Christian ^c   Pfeiffer, Franz ^c   Bunk, Oliver ^c   David, Christian ^c  

^a SIEMENS AG   (Germany)

^b Excellence Cluster Universe   (Germany)

^c PAUL SCHERRER INSTITUTE   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

CONES; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; IMAGING TECHNIQUES; PHASE SHIFT; REFRACTION; X RAYS;

HIGH-RESOLUTION DIFFERENTIAL PHASE CONTRAST IMAGING; LENS ABERRATIONS; REFRACTIVE PROPERTIES; REFRACTIVE X-RAY LENSES;

LENSES;

EID: 34848849322     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2786273     Document Type: Article

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