Direct measurement of antiferromagnetic domain fluctuations

Nature

Volumn 447, Issue 7140, 2007, Pages 68-71

  Shpyrko, O G ^a   Isaacs, E D ^a,c   Logan, J M ^c   Feng, Yejun ^c   Aeppli, G ^d   Jaramillo, R ^c   Kim, H C ^c   Rosenbaum, T F ^c   Zschack, P ^b   Sprung, M ^b   Narayanan, S ^b   Sandy, A R ^b  

^a ARGONNE NATIONAL LABORATORY   (United States)

^b ARGONNE NATIONAL LABORATORY   (United States)

^c UNIVERSITY OF CHICAGO   (United States)

^d UNIVERSITY COLLEGE LONDON   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

CHROMIUM;

CHROMIUM; ELECTRON; MEASUREMENT METHOD; NOISE; TEMPERATURE PROFILE; X-RAY DIFFRACTION; X-RAY SPECTROSCOPY;

ARTICLE; CHEMICAL STRUCTURE; COOLING; ELECTROMAGNETIC FIELD; LOW TEMPERATURE; MAGNETISM; MOLECULAR DYNAMICS; PRIORITY JOURNAL; QUANTUM MECHANICS; TEMPERATURE DEPENDENCE; X RAY DIFFRACTION; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 34247561863     PISSN: 00280836     EISSN: 14764687     Source Type: Journal    
DOI: 10.1038/nature05776     Document Type: Article

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