Pinhole interferometry with coherent hard X-rays

Journal of Synchrotron Radiation

Volumn 11, Issue 2, 2004, Pages 190-197

  Leitenberger, Wolfram ^a   Wendrock, Horst ^b   Bischoff, Lothar ^c   Weitkamp, Timm ^d  

^a UNIVERSITY OF POTSDAM   (Germany)

^b IFW DRESDEN   (Germany)

^c INSTITUTE OF ION BEAM PHYSICS AND MATERIALS RESEARCH   (Germany)

^d PAUL SCHERRER INSTITUTE   (Switzerland)

Author keywords

Coherent X rays; Double slit interferometer; Point diffraction interferometer; Refraction index; White synchrotron beam

Indexed keywords

COMPUTER SIMULATION; LIGHT ABSORPTION; LIGHT INTERFERENCE; OPTICAL BEAM SPLITTERS; REFRACTIVE INDEX; SYNCHROTRON RADIATION; X RAYS;

COHERENT HARD X-RAYS; DOUBLE-SLIT INTERFEROMETER; PINHOLE INTERFEROMETRY; POINT DIFFRACTION INTERFEROMETER; WHITE SYNCHROTRON BEAM;

INTERFEROMETRY;

ARTICLE; EQUIPMENT; EQUIPMENT DESIGN; EVALUATION; FEASIBILITY STUDY; INSTRUMENTATION; INTERFEROMETRY; METHODOLOGY; RADIOMETRY; SENSITIVITY AND SPECIFICITY; SYNCHROTRON; X RAY; X RAY DIFFRACTION;

EQUIPMENT DESIGN; EQUIPMENT FAILURE ANALYSIS; FEASIBILITY STUDIES; INTERFEROMETRY; RADIOMETRY; SENSITIVITY AND SPECIFICITY; SYNCHROTRONS; X-RAY DIFFRACTION; X-RAYS;

EID: 3843098540     PISSN: 09090495     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0909049503029169     Document Type: Review

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