Information depth and kikuchi band contrast in electron backscatter diffraction patterns

Microscopy and Microanalysis

Volumn 15, Issue SUPPL. 2, 2009, Pages 414-415

  Winkelmann, Aimo ^a  

^a MAX PLANCK INSTITUTE OF MICROSTRUCTURE PHYSICS   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 69949120614     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S1431927609094227     Document Type: Article

References (1)

1. A. Winkelmann, C. Trager-Cowan, F. Sweeney, A. P. Day, P. Parbrook Ultramicroscopy 107, 414 (2007)