Microstructure characterization of dislocation wall structure in aluminum using transmission electron microscopy

Journal of Engineering Materials and Technology

Volumn 124, Issue 3, 2002, Pages 297-301

  Gan, J ^a   Vetrano, J S ^a   Khaleel, M A ^a  

^a PACIFIC NORTHWEST NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM; CRYSTAL MICROSTRUCTURE; DEFORMATION; SINGLE CRYSTALS; TENSILE STRENGTH; TRANSMISSION ELECTRON MICROSCOPY; VECTORS;

CELL WALLS; MISORIENTATION ANGLES; TENSILE AXIS; WALL STRUCTURE;

DISLOCATIONS (CRYSTALS);

EID: 10844271576     PISSN: 00944289     EISSN: None     Source Type: Journal    
DOI: 10.1115/1.1479178     Document Type: Article

References (13)

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