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Volumn 112, Issue 21, 2008, Pages 7922-7927

The changing face of PEDOT:PSS films: Substrate, bias, and processing effects on vertical charge transport

Author keywords

[No Author keywords available]

Indexed keywords

AFM MEASUREMENTS; ANNEALING TIMES; APPLIED BIAS; CHARGE TRANSPORTING; CONDUCTIVE ATOMIC FORCE MICROSCOPY; CONDUCTIVE REGIONS; CURRENT FLOWING; DEVICE PERFORMANCES; ETHYLENE DIOXYTHIOPHENE; INSULATING REGIONS; ORGANIC LIGHT-EMITTING; PEDOT:PSS; POLYMER PHOTOVOLTAICS; POLYSTYRENE SULFONATES; PROCESSING EFFECTS; SEMICONDUCTOR LAYERS;

EID: 53349175689     PISSN: 19327447     EISSN: 19327455     Source Type: Journal    
DOI: 10.1021/jp711838h     Document Type: Article
Times cited : (179)

References (35)
  • 4
    • 33846187617 scopus 로고    scopus 로고
    • Lane, P. A.; Kushto, G. P.; Kafafi, Z. H. Appl. Phys. Lett. 2007, 90, 023511 (13)
    • Lane, P. A.; Kushto, G. P.; Kafafi, Z. H. Appl. Phys. Lett. 2007, 90, 023511 (13)
  • 19
    • 53349156315 scopus 로고    scopus 로고
    • H.C. Stark/Bayer Corp. http://www.baytron.com (accessed December 10, 2007).
    • H.C. Stark/Bayer Corp. http://www.baytron.com (accessed December 10, 2007).
  • 34
    • 53349176523 scopus 로고    scopus 로고
    • Due to a large depression in the 30 min sample, the roughness was taken over the area of the image after excluding the lower left portion
    • Due to a large depression in the 30 min sample, the roughness was taken over the area of the image after excluding the lower left portion.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.