Mechanisms of secondary ion emission from self-assembled monolayers and multilayers

Surface and Interface Analysis

Volumn 37, Issue 9, 2005, Pages 721-730

  Wong, Stephen C C ^a   Lockyer, Nicholas P ^a   Vickerman, John C ^a  

^a UNIVERSITY OF MANCHESTER   (United Kingdom)

Author keywords

Desorption; Ion formation; SAMs; Self assembled monolayers; SIMS

Indexed keywords

CARBOXYLIC ACIDS; DESORPTION; ELECTRON EMISSION; ION BOMBARDMENT; IONS; MOLECULAR STRUCTURE; MULTILAYERS; SECONDARY ION MASS SPECTROMETRY; THICKNESS MEASUREMENT;

ION FORMATION; KILOELECTRONVOLT; SAMS; SECONDARY ION EMISSION;

SELF ASSEMBLY;

EID: 24944509656     PISSN: 01422421     EISSN: None     Source Type: Journal    
DOI: 10.1002/sia.2069     Document Type: Article

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