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Volumn 74, Issue 19, 2002, Pages 5009-5016

High-resolution TOF-SIMS study of varying chain length self-assembled monolayer surfaces

Author keywords

[No Author keywords available]

Indexed keywords

CLUSTER FORMATION;

EID: 0036789503     PISSN: 00032700     EISSN: None     Source Type: Journal    
DOI: 10.1021/ac020275s     Document Type: Article
Times cited : (35)

References (33)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.