Bonding Self-Assembled, Compact Organophosphonate Monolayers to the Native Oxide Surface of Silicon

Journal of the American Chemical Society

Volumn 125, Issue 51, 2003, Pages 16074-16080

  Hanson, Eric L ^a   Schwartz, Jeffrey ^a   Nickel, Bert ^a   Koch, Norbert ^a   Danisman, Mehmet Fatih ^a  

^a PRINCETON UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

MOLECULAR PACKING;

ATOMIC FORCE MICROSCOPY; CHEMICAL BONDS; ELECTROMAGNETIC WAVE REFLECTION; GRAVIMETRIC ANALYSIS; MOLECULAR ORIENTATION; ORGANOMETALLICS; OXIDES; SILICON;

SELF ASSEMBLY;

ORGANOPHOSPHONATE DERIVATIVE; OXIDE; PHOSPHONIC ACID DERIVATIVE; SILICON; UNCLASSIFIED DRUG;

ARTICLE; ATOMIC FORCE MICROSCOPY; CHEMICAL BOND; CHEMICAL STRUCTURE; FILM; GRAVIMETRY; MONOLAYER CULTURE; SURFACE PROPERTY; THICKNESS; X RAY ANALYSIS;

EID: 0345733895     PISSN: 00027863     EISSN: None     Source Type: Journal    
DOI: 10.1021/ja035956z     Document Type: Article

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