Swift heavy ion irradiation induced modification of the microstructure of NiO thin films

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 268, Issue 10, 2010, Pages 1613-1617

  Mallick, P ^a,f   Rath, Chandana ^b   Prakash, Jai ^c   Mishra, D K ^d   Choudhary, R J ^e   Phase, D M ^e   Tripathi, A ^c   Avasthi, D K ^c   Kanjilal, D ^c   Mishra, N C ^f  

^a Maharaja Sriram Chandra Bhanja Deo University   (India)

^b BANARAS HINDU UNIVERSITY   (India)

^c INTER UNIVERSITY ACCELERATOR CENTRE   (India)

^d CSIR INSTITUTE OF MINERALS AND MATERIALS TECHNOLOGY   (India)

^e UGC DAE CONSORTIUM FOR SCIENTIFIC RESEARCH   (India)

^f UTKAL UNIVERSITY   (India)

Author keywords

Atomic force microscopy; Ion irradiation; Ion beam induced smoothing; Nanoparticles; NiO

Indexed keywords

COLUMNAR DEFECT; ELECTRONIC ENERGY LOSS; FCC STRUCTURES; FLUENCES; GLANCING ANGLE X-RAY DIFFRACTIONS; GRAIN SIZE; ION FLUENCES; ION IRRADIATION; ION TRACK; MATRIX; NIO FILMS; NIO NANOPARTICLES; NIO THIN FILM; OPTICAL ABSORPTION SPECTROSCOPY; PULSED LASER; SI SUBSTRATES; SWIFT HEAVY ION IRRADIATION;

ABSORPTION SPECTROSCOPY; ATOMIC FORCE MICROSCOPY; ATOMIC SPECTROSCOPY; ATOMS; CHEMICAL MODIFICATION; ELECTRON ENERGY LOSS SPECTROSCOPY; ENERGY DISSIPATION; ION BEAMS; IRRADIATION; MICROSTRUCTURE; NANOPARTICLES; PULSED LASER DEPOSITION; PULSED LASERS; SCANNING ELECTRON MICROSCOPY; SILVER; SPECTRAL DENSITY; SURFACE MORPHOLOGY; SURFACE ROUGHNESS; X RAY DIFFRACTION;

IONS;

EID: 77951024619     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2010.02.005     Document Type: Article

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