HREM investigation of latent tracks in GeS and mica induced by high energy ions

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 141, Issue 1-4, 1998, Pages 747-752

  Vetter, J ^a   Scholz, R ^b   Dobrev, D ^a,c   Nistor, L ^a,d  

^a GSI HELMHOLTZZENTRUM FÜR SCHWERIONENFORSCHUNG GMBH   (Germany)

^b MAX PLANCK INSTITUTE OF MICROSTRUCTURE PHYSICS   (Germany)

^c INSTITUTE OF PHYSICAL CHEMISTRY   (Bulgaria)

^d INSTITUTE OF ATOMIC PHYSICS   (Romania)

Author keywords

Heavy ion irradiation; High resolution TEM; Latent tracks

Indexed keywords

CRYSTAL LATTICES; MICA; PHASE TRANSITIONS; RADIATION EFFECTS; SEMICONDUCTING GERMANIUM COMPOUNDS; SINGLE CRYSTALS; TRANSMISSION ELECTRON MICROSCOPY;

GERMANIUM SULFIDE; HEAVY ION IRRADIATION;

ION BOMBARDMENT;

EID: 0032065894     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(98)00198-0     Document Type: Article

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