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Volumn 256, Issue 2, 2009, Pages 521-523
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Evolution of surface morphology of NiO thin films under swift heavy ion irradiation
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Author keywords
Atomic force microscopy; Ion irradiation; Nanoparticles; NiO
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
HEAVY IONS;
ION BOMBARDMENT;
NANOPARTICLES;
NICKEL OXIDE;
X RAY DIFFRACTION;
ELLIPTICAL PARTICLES;
GLANCING ANGLE X-RAY DIFFRACTIONS;
NIO NANOPARTICLES;
POLYCRYSTALLINE;
PRISTINE FILMS;
SHAPE AND SIZE;
SINGLE-CRYSTALLINE;
SWIFT HEAVY ION IRRADIATION;
THIN FILMS;
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EID: 70449096075
PISSN: 01694332
EISSN: None
Source Type: Journal
DOI: 10.1016/j.apsusc.2009.07.107 Document Type: Article |
Times cited : (16)
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References (13)
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