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Volumn 256, Issue 2, 2009, Pages 521-523

Evolution of surface morphology of NiO thin films under swift heavy ion irradiation

Author keywords

Atomic force microscopy; Ion irradiation; Nanoparticles; NiO

Indexed keywords

ATOMIC FORCE MICROSCOPY; HEAVY IONS; ION BOMBARDMENT; NANOPARTICLES; NICKEL OXIDE; X RAY DIFFRACTION;

EID: 70449096075     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2009.07.107     Document Type: Article
Times cited : (16)

References (13)
  • 10
    • 70449087755 scopus 로고    scopus 로고
    • http://www.srim.org/.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.