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Volumn , Issue , 2009, Pages 146-153

High temperature electronics: R&D challenges and trends in materials, packaging and interconnection technology

Author keywords

HTE; Materials; Miniaturization; Packaging

Indexed keywords

AIRCRAFT CRASH; AMBIENT CONDITIONS; COMPLEX INTERACTION; COMPONENT PACKAGING; ELECTRONIC CONTROL UNITS; ELECTRONIC SYSTEMS; ENVIRONMENTAL CONDITIONS; HIGH RELIABILITY; HIGH-TEMPERATURE ELECTRONICS; HTE; INTERCONNECT TECHNOLOGY; INTERCONNECTION TECHNOLOGY; LIFE EXPECTANCIES; NEW HIGH; OPERATING CONDITION; OPERATING PERIODS; OPERATING TEMPERATURE; SAFETY-CRITICAL; SYSTEM RELIABILITY;

EID: 77950934334     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICASTECH.2009.5409731     Document Type: Conference Paper
Times cited : (39)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.