High-resolution strain mapping in bulk samples using full-profile analysis of energy dispersive synchrotron X-ray diffraction data

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 238, Issue 1-4, 2005, Pages 200-204

  Steuwer, A ^a   Santisteban, J R ^b   Turski, M ^a   Withers, P J ^a   Buslaps, T ^c  

^a UNIVERSITY OF MANCHESTER   (United Kingdom)

^b OPEN UNIVERSITY   (United Kingdom)

^c EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

Author keywords

Diffraction; Energy dispersive; Residual stress; Whole pattern fitting

Indexed keywords

CRACKS; DIFFRACTION; GRAIN SIZE AND SHAPE; RESIDUAL STRESSES; STRAIN; SYNCHROTRON RADIATION;

ENERGY DISPERSIVE; STRAIN FIELDS; STRAIN RESOLUTION; WHOLE-PATTERN FITTING;

STRAIN MEASUREMENT;

EID: 25144523491     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2005.06.049     Document Type: Conference Paper

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