FinFET SRAM design

Proceedings of the IEEE International Conference on VLSI Design

Volumn , Issue , 2010, Pages 440-445

  Joshi, Rajiv ^a   Kim, Keunwoo ^a   Kanj, Rouwaida ^b  

^a IBM T J WATSON RESEARCH CENTER   (United States)

^b IBM AUSTIN RESEARCH LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

FINFET DEVICES; FINFETS; GATED DEVICES; PARAMETER SPACES; SRAM DESIGN; UNIQUE FEATURES;

GATES (TRANSISTOR); LOGIC DESIGN; STATIC RANDOM ACCESS STORAGE;

EMBEDDED SYSTEMS;

EID: 77949974205     PISSN: 10639667     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/VLSI.Design.2010.88     Document Type: Conference Paper

References (15)

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