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Volumn 81, Issue 2, 2010, Pages

Intermittent contact scanning nonlinear dielectric microscopy

Author keywords

[No Author keywords available]

Indexed keywords

CONTACT MODES; DOMAIN STRUCTURE; FERROELECTRIC SINGLE CRYSTALS; INTERMITTENT CONTACT MODES; INTERMITTENT-CONTACTS; LOADING FORCE; NANOSCALE RESOLUTIONS; NOVEL TECHNIQUES; REPRODUCIBILITIES;

EID: 77949295188     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3274138     Document Type: Conference Paper
Times cited : (6)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.