Three-dimensional observation of nanoscale ferroelectric domains using scanning nonlinear dielectric microscopy with electric field correction by Kelvin probe force microscopy

Nanotechnology

Volumn 17, Issue 7, 2006, Pages

  Sugihara, Tomoyuki ^a   Cho, Yasuo ^a  

^a TOHOKU UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC PROPERTIES; ELECTRIC FIELDS; IMAGING TECHNIQUES; NANOSTRUCTURED MATERIALS; POLARIZATION;

DIELECTRIC MICROSCOPY; FERROELECTRIC POLARIZATION; KELVIN PROBE FORCE MICROSCOPY; THREE-DIMENSIONAL IMAGING;

FERROELECTRICITY;

EID: 33644967002     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/17/7/S10     Document Type: Article

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