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Volumn 42, Issue 5, 2010, Pages 1487-1491

Structural and optical properties of ZnO:Mg thin films grown under different oxygen partial pressures

Author keywords

Optical properties; RF magnetron sputtering; X ray diffraction; ZnO:Mg thin films

Indexed keywords

CRYSTAL QUALITIES; DOPED ZNO; FLUORESCENCE SPECTROPHOTOMETER; GRAIN ORIENTATION; GREEN EMISSIONS; MG FILMS; MG THIN FILMS; MG-DOPED; MG-DOPING; OPTICAL BANDS; OXYGEN PARTIAL PRESSURE; PHOTOLUMINESCENCE MEASUREMENTS; RF REACTIVE MAGNETRON SPUTTERING; RF-MAGNETRON SPUTTERING; ROOM TEMPERATURE; SCANNING ELECTRONIC MICROSCOPY; SEM; SHORTER WAVELENGTH; STRUCTURAL AND OPTICAL PROPERTIES; ZNO;

EID: 77349084635     PISSN: 13869477     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.physe.2009.12.005     Document Type: Article
Times cited : (59)

References (30)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.