Influence of Al-doping on the structure and optical properties of ZnO films

Physica B: Condensed Matter

Volumn 404, Issue 16, 2009, Pages 2439-2443

  Ding, J J ^a   Ma, S Y ^a   Chen, H X ^a   Shi, X F ^a   Zhou, T T ^a   Mao, L M ^a  

^a NORTHWEST NORMAL UNIVERSITY   (China)

Author keywords

Atomic force microscopy; Optical properties; Quantum confinement effect; RF magnetron sputtering; X ray diffraction; ZnO thin films

Indexed keywords

AL-CONCENTRATION; AL-DOPED ZNO; AL-DOPING; EXPERIMENTAL VALUES; FLUORESCENCE SPECTROPHOTOMETER; GLASS SUBSTRATES; LUMINESCENCE PROPERTIES; PHOTOLUMINESCENCE SPECTRUM; PL SPECTRA; PREFERRED ORIENTATIONS; QUANTUM CONFINEMENT EFFECT; QUANTUM CONFINEMENT MODELS; RADIO FREQUENCIES; REACTIVE MAGNETRON SPUTTERING; RF MAGNETRON SPUTTERING; ROOM TEMPERATURE; SHORTER WAVELENGTH; UV ABSORPTION; ZNO FILMS; ZNO THIN FILMS; ZNO:AL THIN FILMS;

ABSORPTION; ALUMINUM; ATOMIC FORCE MICROSCOPY; ATOMS; DIFFRACTION; DOPING (ADDITIVES); LIGHT; LUMINESCENCE; MAGNETRON SPUTTERING; MAGNETRONS; METALLIC FILMS; METEOROLOGICAL INSTRUMENTS; OPTICAL MICROSCOPY; OPTICAL PROPERTIES; QUANTUM CONFINEMENT; SEMICONDUCTING ZINC COMPOUNDS; SPECTROPHOTOMETERS; SPECTROPHOTOMETRY; THIN FILMS; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS; ZINC OXIDE;

OPTICAL FILMS;

EID: 67650167697     PISSN: 09214526     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.physb.2009.05.006     Document Type: Article

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