Stress impact on dielectric properties of Bi3.15 Nd0.85 Ti3 O12 films

Applied Physics Letters

Volumn 96, Issue 7, 2010, Pages

  Liu, Yunfei ^a   Kan, Yi ^a   Lu, Xiaomei ^a   Cai, Wei ^a   Wu, Xiaobo ^a   Wu, Xiumei ^b   Wang, Xiaofei ^a   Bo, Huifeng ^a   Huang, Fengzhen ^a   Zhu, Jinsong ^a  

^a NANJING UNIVERSITY   (China)

^b SOUTHEAST UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

AC FIELD; AMBIENT TEMPERATURES; DIELECTRIC CONSTANTS; STRESS IMPACT; STRESS-INDUCED; UNIAXIAL STRESS;

PERMITTIVITY;

EID: 77249123434     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3302460     Document Type: Article

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