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Volumn 83, Issue 12, 2003, Pages 2414-2416
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Orientation dependence of ferroelectric properties of pulsed-laser-ablated Bi4-xNdxTi3O12 films
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Author keywords
[No Author keywords available]
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Indexed keywords
BISMUTH COMPOUNDS;
CRYSTAL ORIENTATION;
FERROELECTRIC MATERIALS;
LASER ABLATION;
NEUTRON DIFFRACTION;
PULSED LASER DEPOSITION;
X RAY DIFFRACTION ANALYSIS;
PULSED LASER ABLATION;
THIN FILMS;
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EID: 0142058395
PISSN: 00036951
EISSN: None
Source Type: Journal
DOI: 10.1063/1.1613052 Document Type: Article |
Times cited : (163)
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References (14)
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