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Volumn 83, Issue 12, 2003, Pages 2414-2416

Orientation dependence of ferroelectric properties of pulsed-laser-ablated Bi4-xNdxTi3O12 films

Author keywords

[No Author keywords available]

Indexed keywords

BISMUTH COMPOUNDS; CRYSTAL ORIENTATION; FERROELECTRIC MATERIALS; LASER ABLATION; NEUTRON DIFFRACTION; PULSED LASER DEPOSITION; X RAY DIFFRACTION ANALYSIS;

EID: 0142058395     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1613052     Document Type: Article
Times cited : (163)

References (14)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.