Temperature dependence of ferroelectric and dielectric properties of PbZr0.5Ti0.5O3 thin film based capacitors

Applied Physics Letters

Volumn 81, Issue 21, 2002, Pages 4035-4037

  Meng, X J ^a   Sun, J L ^a   Wang, X G ^a   Lin, T ^a   Ma, J H ^a   Guo, S L ^a   Chu, J H ^a  

^a SHANGHAI INSTITUTE OF TECHNICAL PHYSICS   (China)

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC PROPERTIES; FERROELECTRICITY; LEAD COMPOUNDS; THERMAL EFFECTS; THIN FILMS;

FERROELECTRIC PROPERTIES;

CAPACITORS;

EID: 0037132305     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1522833     Document Type: Article

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