Mechanical stress induced polarization reorientation in polycrystalline Bi3.25La0.75Ti3O12 films

Physics Letters, Section A: General, Atomic and Solid State Physics

Volumn 374, Issue 2, 2009, Pages 360-365

  Kan, Yi ^a   Liu, Yunfei ^a   Mieth, Oliver ^b   Bo, Huifeng ^a   Wu, Xiumei ^c   Lu, Xiaomei ^a   Eng, Lukas M ^b   Zhu, Jinsong ^a  

^a NANJING UNIVERSITY   (China)

^b DRESDEN UNIVERSITY OF TECHNOLOGY   (Germany)

^c SOUTHEAST UNIVERSITY   (China)

Author keywords

Dynamic domain change; Scanning probe microscope; Stress impact; Thin film ferroelectrics

Indexed keywords

BISMUTH COMPOUNDS; LANTHANUM COMPOUNDS; POLARIZATION; SCANNING PROBE MICROSCOPY; THIN FILMS; TITANIUM COMPOUNDS;

BI3.25LA0.75TI3O12 FILMS; DOMAIN PATTERN; DYNAMIC DOMAINS; MECHANICAL STRESS; POLYCRYSTALLINE; STRESS IMPACT; STRESS-INDUCED POLARIZATION; THIN FILM FERROELECTRICS;

STRESSES;

EID: 71849088187     PISSN: 03759601     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.physleta.2009.10.084     Document Type: Article

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