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Volumn 96, Issue 7, 2010, Pages

Interfacial effect on metal/oxide nanowire junctions

(7) Nagashima, Kazuki a Yanagida, Takeshi a,b Klamchuen, Annop a Kanai, Masaki a Oka, Keisuke a Seki, Shu a,b Kawai, Tomoji a

a OSAKA UNIVERSITY (Japan)

b JAPAN SCIENCE AND TECHNOLOGY AGENCY (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CONDUCTIVE OXIDES; ELECTRONIC DEVICE; FOUR-ORDER; INTERFACIAL EFFECTS; INTERFACIAL LAYER; MICROWAVE CONDUCTIVITY; N-TYPE SEMICONDUCTORS; NANO-DEVICES; NANOWIRE JUNCTIONS; NON-CONTACT; TWO-TERMINAL DEVICES;

NANOWIRES; OXYGEN; OXYGEN VACANCIES;

SEMICONDUCTOR JUNCTIONS;

EID: 77249099863 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.3318257 Document Type: Article

Times cited : (24)

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