Fringing field effects on electrical resistivity of semiconductor nanowire-metal contacts

Applied Physics Letters

Volumn 92, Issue 8, 2008, Pages

  Hu, Jun ^a   Liu, Yang ^b   Ning, C Z ^c   Dutton, Robert ^b   Kang, Sung Mo ^d  

^a University of California Santa Cruz   (United States)

^b STANFORD UNIVERSITY   (United States)

^c Arizona State University   (United States)

^d University of California   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; ELECTRIC CONDUCTIVITY; ELECTRIC FIELD EFFECTS; SEMICONDUCTOR DEVICES; TEMPERATURE MEASUREMENT;

FRINGING FIELD EFFECTS; METAL CONTACTS; NANOWIRE-METAL CONTACTS; SEMICONDUCTOR NANOWIRE-METAL CONTACTS;

NANOWIRES;

EID: 40049092325     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2889534     Document Type: Article

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