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Volumn 8, Issue 1-3, 2003, Pages 319-326

Determination of complex dielectric permittivity of loss materials at microwave frequencies

Author keywords

Cement based materials; Complex dielectric permittivity of loss materials; Microwave measurement; Root finding and graphical methods

Indexed keywords

DIELECTRIC MATERIALS; FREQUENCIES; MICROWAVE MEASUREMENT; MICROWAVES; PERMITTIVITY;

EID: 0038372651     PISSN: 1300686X     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Conference Paper
Times cited : (5)

References (9)
  • 2
    • 0032638689 scopus 로고    scopus 로고
    • Permittivity determination using amplitudes of transmission and reflection coefficients at microwave frequency
    • Z.Ma, and S.Okamura, Permittivity determination using amplitudes of transmission and reflection coefficients at microwave frequency, IEEE Microwave Theory and Tech., vol. 47, no. 5, pp. 546-550, 1999.
    • (1999) IEEE Microwave Theory and Tech. , vol.47 , Issue.5 , pp. 546-550
    • Ma, Z.1    Okamura, S.2
  • 3
    • 0003615874 scopus 로고
    • McGraw-Hill International Editions
    • rd ed. McGraw-Hill International Editions, 1987.
    • (1987) rd Ed.
    • Rice, J.R.1
  • 7
    • 0030106846 scopus 로고    scopus 로고
    • A comparison of theoretical and empirical reflection coefficients for typical exterior wall surfaces in a mobile radio environment
    • March
    • O.Landron, M.J.Feuerstein, T.S.Rappaport, A comparison of theoretical and empirical reflection coefficients for typical exterior wall surfaces in a mobile radio environment, IEEE Trans. Antennas Propagat., vol. 44, no. 3, pp. 341-351, March 1996.
    • (1996) IEEE Trans. Antennas Propagat. , vol.44 , Issue.3 , pp. 341-351
    • Landron, O.1    Feuerstein, M.J.2    Rappaport, T.S.3
  • 8
    • 0032098081 scopus 로고    scopus 로고
    • Characterization of layered dielectric medium using reflection coefficient
    • June
    • Y. Huang and M. Nakhkash, Characterization of layered dielectric medium using reflection coefficient, Electronics Letters, vol. 34, no. 12, pp. 1207-1208, June 1998.
    • (1998) Electronics Letters , vol.34 , Issue.12 , pp. 1207-1208
    • Huang, Y.1    Nakhkash, M.2
  • 9
    • 0032162475 scopus 로고    scopus 로고
    • Nondestructive microwave characterization for determining the bulk density and moisture content of shelled corn
    • S. Trabelsi, A. W. Kraszewski, and S. O. Nelson, Nondestructive microwave characterization for determining the bulk density and moisture content of shelled corn, Meas. Sci. Technol., vol. 9, pp. 1548-1556, 1998.
    • (1998) Meas. Sci. Technol. , vol.9 , pp. 1548-1556
    • Trabelsi, S.1    Kraszewski, A.W.2    Nelson, S.O.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.