Phase-shift ambiguity in microwave dielectric properties measurements

IEEE Transactions on Instrumentation and Measurement

Volumn 49, Issue 1, 2000, Pages 56-60

  Trabelsi, Samir ^a,b   Kraszewski, Andrzej W ^a,b   Nelson, Stuart O ^a,b  

^a IEEE   (United States)

^b RUSSELL RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

MICROWAVE DIELECTRIC PROPERTIES MEASUREMENTS;

DENSITY MEASUREMENT (SPECIFIC GRAVITY); MOISTURE DETERMINATION; PERMITTIVITY MEASUREMENT; PHASE SHIFT;

MICROWAVE MEASUREMENT;

EID: 0033747064     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/19.836309     Document Type: Article

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