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Volumn 23, Issue 1, 2010, Pages 30-38

Scale, scope, and speed - Managing the challenges of multiproduct manufacturing

Author keywords

Cycle time; Multiproduct; Scale; Scope; Speed

Indexed keywords

APRIORI; COMMODITY COMPONENTS; COST STRUCTURE; CYCLE TIME; ECONOMIC CONSEQUENCES; ECONOMIC ENVIRONMENT; FAB PERFORMANCE; INTEGRATED APPROACH; MANUFACTURING CYCLE TIME; MULTI-PRODUCTS; MULTIPRODUCT; MULTIPRODUCT MANUFACTURING; NET PROFITS; PRODUCT CLASS; PRODUCTION PLANS; SALES PRICES; TIME DEPENDENT;

EID: 76849097608     PISSN: 08946507     EISSN: None     Source Type: Journal    
DOI: 10.1109/TSM.2009.2039249     Document Type: Article
Times cited : (15)

References (30)
  • 1
    • 0000273410 scopus 로고
    • Capital productivity: Major challenge for the semiconductor industry
    • P. Silverman, "Capital productivity: Major challenge for the semiconductor industry," Solid State Technol., vol.37, no.3, p. 104, 1994.
    • (1994) Solid State Technol , vol.37 , Issue.3 , pp. 104
    • Silverman, P.1
  • 2
    • 76849114222 scopus 로고    scopus 로고
    • The economics of speed
    • presented at Portland State Univ., Portland, OR, Nov. 3
    • R. C. Leachman, "The economics of speed," presented at the ETM Seminar, Portland State Univ., Portland, OR, Nov. 3, 2005.
    • (2005) The ETM Seminar
    • Leachman, R.C.1
  • 3
    • 33846902258 scopus 로고    scopus 로고
    • Integration of speed economics into decision- making for manufacturing management
    • R. C. Leachman and S. Ding, "Integration of speed economics into decision- making for manufacturing management," in Int. J. Prod. Econ., 2007, pp. 39-55.
    • (2007) Int. J. Prod. Econ. , pp. 39-55
    • Leachman, R.C.1    Ding, S.2
  • 4
    • 0035283518 scopus 로고    scopus 로고
    • Learning and process improvement during production ramp-up
    • C. Terwiesch and R. E. Bohn, "Learning and process improvement during production ramp-up," Int. J. Prod. Econ., vol.70, no.1, pp. 1-19, 2001.
    • (2001) Int. J. Prod. Econ. , vol.70 , Issue.1 , pp. 11-19
    • Terwiesch, C.1    Bohn, R.E.2
  • 5
    • 0002439131 scopus 로고
    • Time and transition in work teams: Toward a new model of group development
    • C. J. G. Gersick, "Time and transition in work teams: Toward a new model of group development," Acad. Manage. J., vol.31, no.1, pp. 9-41, 1988.
    • (1988) Acad. Manage. J. , vol.31 , Issue.1 , pp. 9-41
    • Gersick, C.J.G.1
  • 6
    • 76849093624 scopus 로고
    • Note on the structural analysis of industries Harvard Business School
    • M. Porter, Note on the structural analysis of industries Harvard Business School, 1983, Case Study 9-376-1054
    • (1983) Case Study 9-376-1054
    • Porter, M.1
  • 8
    • 0002544864 scopus 로고
    • VLSI research and development in the US and Japan
    • Y. Nishi, "VLSI research and development in the US and Japan," in Proc. Mater. Res. Symp. VLSI V, 1990, pp. 3-11.
    • (1990) Proc. Mater. Res. Symp. VLSI , vol.5 , pp. 3-11
    • Nishi, Y.1
  • 9
    • 9144249190 scopus 로고    scopus 로고
    • Yield learning and the sources of profitability in semiconductor manufacturing and process development
    • Nov.
    • C. Weber, "Yield learning and the sources of profitability in semiconductor manufacturing and process development," IEEE Trans. Semicond. Manuf., vol.17, no.2, pp. 590-596, Nov. 2004.
    • (2004) IEEE Trans. Semicond. Manuf. , vol.17 , Issue.2 , pp. 590-596
    • Weber, C.1
  • 10
    • 0033284013 scopus 로고    scopus 로고
    • The economics of yield-driven processes
    • R. E. Bohn and C. Terwiesch, "The economics of yield-driven processes," J. Oper. Manage., vol.18, no.1, pp. 41-59, 1999.
    • (1999) J. Oper. Manage. , vol.18 , Issue.1 , pp. 41-59
    • Bohn, R.E.1    Terwiesch, C.2
  • 12
    • 0000634867 scopus 로고
    • Strategic decision processes in high-velocity environments: Four cases in the microcomputer industry
    • L. J. Bourgeois, III and K. M. Eisenhardt, "Strategic decision processes in high-velocity environments: Four cases in the microcomputer industry," Manage. Sci., vol.34, no.7, pp. 816-835, 1988.
    • (1988) Manage. Sci. , vol.34 , Issue.7 , pp. 816-835
    • Bourgeois III, L.J.1    Eisenhardt, K.M.2
  • 13
    • 49149083932 scopus 로고    scopus 로고
    • Characterizing the operating curve-How can semiconductor fabs grade themselves?
    • Oct.
    • A. Fayed and B. Dunnigan, "Characterizing the operating curve-How can semiconductor fabs grade themselves?," in Proc. ISSM, Oct. 2007, pp. 289-292.
    • (2007) Proc. ISSM , pp. 289-292
    • Fayed, A.1    Dunnigan, B.2
  • 14
    • 0036568118 scopus 로고    scopus 로고
    • SeDFAM: Semiconductor demand forecast accuracy model
    • Nov.
    • M. Çakanyildirim and R. O. Roundy, "SeDFAM: Semiconductor demand forecast accuracy model," IIE Trans., vol.34, no.5, pp. 449-465, Nov. 2002.
    • (2002) IIE Trans , vol.34 , Issue.5 , pp. 449-465
    • Çakanyildirim, M.1    Roundy, R.O.2
  • 15
    • 0013367503 scopus 로고    scopus 로고
    • IMPReSS: An automated production planning and delivery quotation system at Harris corporation-Semiconductor sector
    • R. C. Leachman, R. F. Benson, C. Liu, and D. J. Raar, "IMPReSS: An automated production planning and delivery quotation system at Harris corporation-Semiconductor sector," Interfaces, vol.26, pp. 6-37, 1996.
    • (1996) Interfaces , vol.26 , pp. 6-37
    • Leachman, R.C.1    Benson, R.F.2    Liu, C.3    Raar, D.J.4
  • 16
    • 0031382160 scopus 로고    scopus 로고
    • The operating curve: A method to measure and benchmark manufacturing line productivity
    • Sep. 10-12
    • S. S. Aurand and P. J. Miller, "The operating curve: A method to measure and benchmark manufacturing line productivity," in Proc. IEEE/ SEMI-ASMC, Sep. 10-12, 1997, pp. 391-397.
    • (1997) Proc. IEEE/ SEMI-ASMC , pp. 391-397
    • Aurand, S.S.1    Miller, P.J.2
  • 17
    • 0038180890 scopus 로고    scopus 로고
    • Cycle time reduction at a major texas instruments wafer fab
    • Mar.-Apr. 31-1
    • K. Potti and M. Whitaker, "Cycle time reduction at a major texas instruments wafer fab," in Proc. IEEE/SEMI-ASMC, Mar.-Apr. 31-1, 2003, pp. 106-110.
    • (2003) Proc. IEEE/SEMI-ASMC , pp. 106-110
    • Potti, K.1    Whitaker, M.2
  • 19
    • 34250195301 scopus 로고    scopus 로고
    • Production planning with load dependent lead times: An update of research
    • J. Pahl, D. Woodruff, and S. Voß, "Production planning with load dependent lead times: An update of research," Ann. Oper. Res., vol.153, pp. 297-345, 2007.
    • (2007) Ann. Oper. Res. , vol.153 , pp. 297-345
    • Pahl, J.1    Woodruff, D.2    Voß, S.3
  • 20
    • 33144460387 scopus 로고    scopus 로고
    • Tractable nonlinear production planning models for semiconductor wafer fabrication facilities
    • Feb.
    • J. M. Asmundsson, R. L. Rardin, and R. Uzsoy, "Tractable nonlinear production planning models for semiconductor wafer fabrication facilities," IEEE Trans. Semicond. Manuf., vol.19, no.1, pp. 95-111, Feb. 2006.
    • (2006) IEEE Trans. Semicond. Manuf. , vol.19 , Issue.1 , pp. 95-111
    • Asmundsson, J.M.1    Rardin, R.L.2    Uzsoy, R.3
  • 21
    • 63449135698 scopus 로고    scopus 로고
    • Production planning models with resources subject to congestion
    • J. M. Asmundsson, R. L. Rardin, C. H. Turkseven, and R. Uzsoy, "Production planning models with resources subject to congestion," Naval Res. Logist., vol.56, pp. 142-157, 2009.
    • (2009) Naval Res. Logist. , vol.56 , pp. 142-157
    • Asmundsson, J.M.1    Rardin, R.L.2    Turkseven, C.H.3    Uzsoy, R.4
  • 22
    • 33747829633 scopus 로고    scopus 로고
    • Quantifying the benefits of cycle-time reduction in semiconductor wafer fabrication
    • Jan.
    • K. Nemoto, E. Akcali, and R. Uzsoy, "Quantifying the benefits of cycle-time reduction in semiconductor wafer fabrication," IEEE Trans. Electron. Packag. Manuf., vol.23, no.1, pp. 39-47, Jan. 2000.
    • (2000) IEEE Trans. Electron. Packag. Manuf. , vol.23 , Issue.1 , pp. 39-47
    • Nemoto, K.1    Akcali, E.2    Uzsoy, R.3
  • 23
    • 28444461369 scopus 로고    scopus 로고
    • A simulation-based evaluation of the cost of cycle time reduction in Agere Systems wafer fabrication facility-A case study
    • D. Nazzal, M. Mollaghasemi, and D. Anderson, "A simulation-based evaluation of the cost of cycle time reduction in Agere Systems wafer fabrication facility-A case study," Int. J. Prod. Econ., pp. 300-313, 2006.
    • (2006) Int. J. Prod. Econ. , pp. 300-313
    • Nazzal, D.1    Mollaghasemi, M.2    Anderson, D.3
  • 24
    • 50849104269 scopus 로고    scopus 로고
    • Do learning organizations have strokes of genius?
    • Istanbul, Turkey, Jul. 8-13
    • C. M. Weber, "Do learning organizations have strokes of genius?," in Proc. PICMET '06, Istanbul, Turkey, Jul. 8-13, 2006.
    • (2006) Proc. PICMET '06
    • Weber, C.M.1
  • 25
    • 49149110148 scopus 로고    scopus 로고
    • Optimizing the operating curve: How can every fab maximize its performance?
    • Boston, MA, May 4-6
    • A. Fayed and C. M.Weber, "Optimizing the operating curve: How can every fab maximize its performance?," in Proc. IEEE/SEMI-ASMC, Boston, MA, May 4-6, 2008, pp. 286-291.
    • (2008) Proc. IEEE/SEMI-ASMC , pp. 286-291
    • Fayed, A.1    Weber, C.M.2
  • 26
    • 70350238112 scopus 로고    scopus 로고
    • Managing the challenges of multi-product manufacturing
    • Berlin, Germany, May 11-13
    • C. M.Weber and A. Fayed, "Managing the challenges of multi-product manufacturing," in Proc. IEEE/SEMI-ASMC, Berlin, Germany, May 11-13, 2009.
    • (2009) Proc. IEEE/SEMI-ASMC
    • Weber, C.M.1    Fayed, A.2
  • 27
    • 3843113981 scopus 로고
    • Break-even analysis for lockheed's tri star: An application of financial theory
    • Sep.
    • U. E. Reinhardt, "Break-even analysis for lockheed's tri star: An application of financial theory," J. Finance, vol.28, no.4, pp. 821-838, Sep. 1973.
    • (1973) J. Finance , vol.28 , Issue.4 , pp. 821-838
    • Reinhardt, U.E.1
  • 28
    • 33751531825 scopus 로고    scopus 로고
    • The economics of photomask manufacturing and their impact on semiconductor manufacturing
    • Nov.
    • C. M.Weber, C. N. Berglund, and P. Gabella, "The economics of photomask manufacturing and their impact on semiconductor manufacturing," IEEE Trans. Semicond. Manuf., vol.19, no.4, pp. 465-474, Nov. 2006.
    • (2006) IEEE Trans. Semicond. Manuf. , vol.19 , Issue.4 , pp. 465-474
    • Weber, C.M.1    Berglund, C.N.2    Gabella, P.3
  • 29
    • 0003294484 scopus 로고
    • The reasoning behind cost of ownership
    • May
    • J. Secrest and P. Burggraaf, "The reasoning behind cost of ownership," Semicond. Int., pp. 56-60, May 1993.
    • (1993) Semicond. Int. , pp. 56-60
    • Secrest, J.1    Burggraaf, P.2
  • 30
    • 0001817978 scopus 로고
    • Applications of cost of ownership
    • Sep.
    • D. Dance and D. Jimenez, "Applications of cost of ownership," Semicond. Int., pp. 6-7, Sep. 1994.
    • (1994) Semicond. Int. , pp. 6-7
    • Dance, D.1    Jimenez, D.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.