Tractable nonlinear production planning models for semiconductor wafer fabrication facilities

IEEE Transactions on Semiconductor Manufacturing

Volumn 19, Issue 1, 2006, Pages 95-111

  Asmundsson, Jakob ^a,b,d   Rardin, Ronald L ^a,c,e,f,g   Uzsoy, Reha ^a,c,h  

^a IEEE   (United States)

^b Treasury and Risk Management   (Iceland)

^c SCHOOL OF INDUSTRIAL ENGINEERING   (United States)

^d Straumur Burdaras Investment Bank ^*  (Iceland)

^e PURDUE UNIVERSITY   (United States)

^f Purdue Energy Modeling Research Groups (PEMRG)   (United States)

^g Academic Program   (United States)

^h Laboratory for Extended Enterprises   (United States)

Author keywords

Cycle times; Linear programming; Production planning; Wafer fabrication

Indexed keywords

PRODUCTION PLANNING; SCALED-DOWN MODEL; WAFER FABRICATION;

ALGORITHMS; COMPUTER SIMULATION; LINEAR PROGRAMMING; SENSITIVITY ANALYSIS; SILICON WAFERS;

SEMICONDUCTOR DEVICE MANUFACTURE;

EID: 33144460387     PISSN: 08946507     EISSN: None     Source Type: Journal    
DOI: 10.1109/TSM.2005.863214     Document Type: Conference Paper

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