Cycle time reduction at a major Texas Instruments wafer fab

IEEE International Symposium on Semiconductor Manufacturing Conference, Proceedings

Volumn , Issue , 2003, Pages 106-110

  Potti, Kishore ^a   Whitaker, Mark ^a  

^a TEXAS INSTRUMENTS   (United States)

Author keywords

ASAP; Cycle time; Operating curve

Indexed keywords

COMPUTER SIMULATION; MATHEMATICAL MODELS; PROCESS CONTROL; SCHEDULING;

CYCLE TIME REDUCTION; OPERATING CURVE;

SEMICONDUCTOR DEVICE MANUFACTURE;

EID: 0038180890     PISSN: 1523553X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (1)

1. J. W. Fowler and J. K. Robinson. 1995, "Measurement and Improvement of Manufacturing Capacity (MIMAC) Project Final Report," SEMATECH Technology Transfer #95062861A-TR.