Yield learning and the sources of profitability in semiconductor manufacturing and process development

IEEE Transactions on Semiconductor Manufacturing

Volumn 17, Issue 4, 2004, Pages 590-596

  Weber, Charles ^a  

^a Portland State University   (United States)

Author keywords

Profitability; Semiconductor manufacturing; Yield learning

Indexed keywords

FABRICATION; INTEGRATED CIRCUIT MANUFACTURE; INTEGRATED CIRCUITS; MATHEMATICAL MODELS; SILICON WAFERS; SPECIFICATIONS;

COST MINIMIZATION; PROFITABILITY; SEMICONDUCTOR MANUFACTURING; YIELD LEARNING;

SEMICONDUCTOR DEVICE MANUFACTURE;

EID: 9144249190     PISSN: 08946507     EISSN: None     Source Type: Journal    
DOI: 10.1109/TSM.2004.835724     Document Type: Article

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