Characterizing the operating curve - How can semiconductor fabs grade themselves?

IEEE International Symposium on Semiconductor Manufacturing Conference Proceedings

Volumn , Issue , 2007, Pages 289-292

  Fayed, Asser ^a   Dunnigan, Bill ^a  

^a CYPRESS SEMICONDUCTOR   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BIOLOGICAL MATERIALS; ELECTRIC CONDUCTIVITY; THROUGHPUT;

CONTINUOUS IMPROVEMENTS; INTERNATIONAL SYMPOSIUM; QUEUING ANALYSIS; SEMICONDUCTOR FABS; SEMICONDUCTOR MANUFACTURING;

SEMICONDUCTOR MATERIALS;

EID: 49149083932     PISSN: 1523553X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ISSM.2007.4446827     Document Type: Conference Paper

References (8)

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2. Steven S. Aurand, Peter J. Miller, "The Operating Curve: A Method to Measure and Benchmark Manufacturing Line Productivity," Advanced Semiconductor Manufacturing Conference and Workshop, 1997. IEEE /SEMI Volume, Issue, 10-12 Sep 1997 Page(s):391-397
3. Wallace Hopp and Mark Spearman, "Factory Physics" McGraw-Hill/Irwin; 2 edition (April 4, 2000)
4. Oliver Rose, "Economy of Scale Effects for Large Wafer Fabs," Proceedings of the 2006 Winter Simulation Conference
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6. Rachel T. Johnson, Feng Yang, Bruce E. Ankenman, and Barry L. Nelson, "NonLinear Regression Fits for Simulated Cycle-time vs. Throughput Curves for Semiconductor Manufacturing" Proceedings of the 2004Winter Simulation Conference
7. John Fowler and Jennifer Robinson, "Source: SEMATECH - Measurement and Improvement of Manufacturing Capacity (MIMAC) Designed Experiment Report"
8. A. K. Schoemig, "On the Corrupting Influence of variability in Semiconductor Manufacturing," Proceedings of the 1999 Winter Simulation Conference.