Operating curve: a method to measure and benchmark manufacturing line productivity

IEEE/SEMI Advanced Semiconductor Manufacturing Conference and Workshop

Volumn , Issue , 1997, Pages 391-397

  Aurand, Steven S ^a   Miller, Peter J ^a  

^a IBM   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

FABRICATION; OPERATIONS RESEARCH; PERFORMANCE; PRODUCTIVITY;

CONTINUOUS FLOW MANUFACTURING; OPERATING CURVE; PERFORMANCE INDEX; RAW PROCESS TIMES;

SEMICONDUCTOR DEVICE MANUFACTURE;

EID: 0031382160     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (3)