Optimizing the operating curve: How can every fab maximize its performance?

ASMC (Advanced Semiconductor Manufacturing Conference) Proceedings

Volumn , Issue , 2008, Pages 286-291

  Fayed, Asser ^a   Weber, Charles M ^b  

^a CYPRESS SEMICONDUCTOR   (United States)

^b PORTLAND STATE UNIVERSITY   (United States)

Author keywords

Operating curve; Optimizing; Value driven

Indexed keywords

ELECTRIC CONDUCTIVITY;

OPERATING CURVE; OPTIMIZING; REALISTIC CONDITIONS; SEMICONDUCTOR MANUFACTURING; VALUE DRIVEN;

SEMICONDUCTOR MATERIALS;

EID: 49149110148     PISSN: 10788743     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ASMC.2008.4529055     Document Type: Conference Paper

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