메뉴 건너뛰기




Volumn 54, Issue 3, 2010, Pages 268-274

Compact model of the IGBTs with localized lifetime control dedicated to power circuit simulations

Author keywords

Control; IGBT; Lifetime; Modeling; Power

Indexed keywords

COMPACT MODEL; ELECTRICAL PERFORMANCE; IGBT; LOCALIZED LIFETIME CONTROL; MODELING POWER; PHYSICS-BASED; POWER CIRCUIT; PULSE-WIDTH-MODULATED; SINGLE PHASE; SUB-CIRCUITS; TOTAL POWER; TWO-DIMENSIONAL NUMERICAL SIMULATION;

EID: 76549120712     PISSN: 00381101     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.sse.2009.10.014     Document Type: Article
Times cited : (4)

References (24)
  • 4
    • 0001044615 scopus 로고    scopus 로고
    • Lifetime control in silicon devices by voids induced by He ion implantation
    • Raineri V., Fallica G., and Libertino S. Lifetime control in silicon devices by voids induced by He ion implantation. J Appl Phys 79 12 (1996) 9012
    • (1996) J Appl Phys , vol.79 , Issue.12 , pp. 9012
    • Raineri, V.1    Fallica, G.2    Libertino, S.3
  • 6
    • 0033154001 scopus 로고    scopus 로고
    • Numerical analysis of local lifetime control for high-speed low-loss P-i-N diode design
    • Napoli E., Strollo A.G.M., and Spirito P. Numerical analysis of local lifetime control for high-speed low-loss P-i-N diode design. IEEE Trans Power Electron 14 4 (1999) 615
    • (1999) IEEE Trans Power Electron , vol.14 , Issue.4 , pp. 615
    • Napoli, E.1    Strollo, A.G.M.2    Spirito, P.3
  • 9
    • 76549086646 scopus 로고    scopus 로고
    • ATLAS users manual, CA, Silvaco International;
    • ATLAS users manual. Santa Clara (CA): Silvaco International; 1998.
    • (1998) Santa Clara
  • 11
    • 76549087848 scopus 로고    scopus 로고
    • Bryant AT, Palmer PR, Santi E, Hudgins JL, Mawby PA. Review of advanced power device models for converter design and simulation. In: International conference on information and communication technology in electrical sciences (ICTES 2007). Tamilnadu, India; 2007. p. 1-6.
    • Bryant AT, Palmer PR, Santi E, Hudgins JL, Mawby PA. Review of advanced power device models for converter design and simulation. In: International conference on information and communication technology in electrical sciences (ICTES 2007). Tamilnadu, India; 2007. p. 1-6.
  • 12
    • 2442534670 scopus 로고    scopus 로고
    • A 2D physically based compact model for advanced power bipolar devices
    • Igic P.M., Towers M.S., and Mawby P.A. A 2D physically based compact model for advanced power bipolar devices. Microelectron J 35 7 (2004) 591-594
    • (2004) Microelectron J , vol.35 , Issue.7 , pp. 591-594
    • Igic, P.M.1    Towers, M.S.2    Mawby, P.A.3
  • 13
    • 0036641777 scopus 로고    scopus 로고
    • Investigation of the power dissipation during IGBT turn-off using a new physics-based IGBT compact model
    • Mawby P.A., Towers M.S., Jamal W., and Batcup S.G.J. Investigation of the power dissipation during IGBT turn-off using a new physics-based IGBT compact model. Microelectron Reliab 42 7 (2002) 1045-1052
    • (2002) Microelectron Reliab , vol.42 , Issue.7 , pp. 1045-1052
    • Mawby, P.A.1    Towers, M.S.2    Jamal, W.3    Batcup, S.G.J.4
  • 14
    • 0024105667 scopus 로고
    • A physically based mobility model for numerical simulation of non-planar devices
    • Lombardi, et al. A physically based mobility model for numerical simulation of non-planar devices. IEEE Trans CAD (1988) 1164
    • (1988) IEEE Trans CAD , pp. 1164
    • Lombardi1
  • 15
    • 0026899612 scopus 로고
    • A unified mobility model for device simulation - I. Model equations and concentration dependence
    • Klaassen D.B.M. A unified mobility model for device simulation - I. Model equations and concentration dependence. Solid State Electron 35 7 (1992) 953-959
    • (1992) Solid State Electron , vol.35 , Issue.7 , pp. 953-959
    • Klaassen, D.B.M.1
  • 16
    • 0026899752 scopus 로고
    • A unified mobility model for device simulation - II. Temperature dependence of carrier mobility and lifetime
    • Klaassen D.B.M. A unified mobility model for device simulation - II. Temperature dependence of carrier mobility and lifetime. Solid State Electron 35 7 (1992) 961-967
    • (1992) Solid State Electron , vol.35 , Issue.7 , pp. 961-967
    • Klaassen, D.B.M.1
  • 17
    • 0009509593 scopus 로고
    • Carrier mobilities in silicon empirically related to doping and field
    • Caughey D.M., and Thomas R.E. Carrier mobilities in silicon empirically related to doping and field. Proc IEEE 55 (1967) 2192-2193
    • (1967) Proc IEEE , vol.55 , pp. 2192-2193
    • Caughey, D.M.1    Thomas, R.E.2
  • 18
    • 0026820842 scopus 로고
    • Unified apparent bandgap narrowing in n- and p-type silicon
    • Klaassen D.B.M., Slotboom J.W., and De Graaff H.C. Unified apparent bandgap narrowing in n- and p-type silicon. Solid State Electron 35 2 (1992) 125-129
    • (1992) Solid State Electron , vol.35 , Issue.2 , pp. 125-129
    • Klaassen, D.B.M.1    Slotboom, J.W.2    De Graaff, H.C.3
  • 19
    • 0020089607 scopus 로고
    • Modeling and measurement of minority-carrier lifetime versus doping in diffused layers of n ± p silicon diodes
    • Roulston D.J., Arora N.D., and Chamberlain S.G. Modeling and measurement of minority-carrier lifetime versus doping in diffused layers of n ± p silicon diodes. IEEE Trans Electron Dev ED-29 February (1982) 284-291
    • (1982) IEEE Trans Electron Dev , vol.ED-29 , Issue.February , pp. 284-291
    • Roulston, D.J.1    Arora, N.D.2    Chamberlain, S.G.3
  • 20
    • 0001078652 scopus 로고
    • Auger coefficient for highly doped and highly excited silicon
    • Dziewior J., and Schmid W. Auger coefficient for highly doped and highly excited silicon. Appl Phys Lett 31 (1977) 346-348
    • (1977) Appl Phys Lett , vol.31 , pp. 346-348
    • Dziewior, J.1    Schmid, W.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.