Simultaneous Z-contrast/phase contrast imaging of ferroelectric thin films

Microscopy and Microanalysis

Volumn 15, Issue SUPPL. 2, 2009, Pages 1464-1465

  Chisholm, M F ^a   Lee, H N ^a   Luo, W ^a,b   Pantelides, S T ^a,b  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

^b VANDERBILT UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 69949170107     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S1431927609097438     Document Type: Article

References (6)

1. J.M. Cowley, Appl.Phys. Lett. 15 (1969) 58.
2. C.-L. Jia, Science 303 (2004) 2001.
3. C.-L. Jia, M. Lentzen, and K. Urban, Science 299 (2003) 870.
4. C.-L. Jia, et al., Nature Materials 7 (2008) 57.
5. W. Tian, et al., in Ferroelectric Thin Films IX, Vol. 655, Materials Research Society, Warrendale, 2000, pp. CC7.8.1-6.
6. This research was sponsored by the Division of Materials Sciences and Engineering, U.S. Department of Energy.