Diffracted phase and amplitude measurements by energy-filtered convergent-beam holography (CHEF)

Ultramicroscopy

Volumn 108, Issue 3, 2008, Pages 285-294

  Houdellier, F ^a   Hytch M J ^a  

^a CEMES CNRS   (France)

Author keywords

Aberration correction; Convergent beam electron diffraction; Electron holography

Indexed keywords

ABERRATIONS; COMPUTER SIMULATION; ELECTRON DIFFRACTION; ELECTRON HOLOGRAPHY;

ABERRATION CORRECTION; IMAGING ENERGY FILTER; MICROSCOPE TRANSFER THEORY;

LIGHT INTERFERENCE;

AMPLITUDE MODULATION; ARTICLE; ELECTRON DIFFRACTION; ENERGY FILTERED TRANSMISSION ELECTRON MICROSCOPY; ENERGY TRANSFER; SIGNAL NOISE RATIO;

CLUPEIDAE;

EID: 38349173181     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2007.08.016     Document Type: Article

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