Moiré-like fringes in transmission electron microscopy images of coherently strained semiconductor islands

Ultramicroscopy

Volumn 93, Issue 2, 2002, Pages 161-167

  Androussi, Y ^a   Benabbas, T ^a   Lefebvre, A ^a  

^a UNIV LILLE   (France)

Author keywords

Composition measurements; Quantum dots; Strain contrast; Transmission electron microscopy

Indexed keywords

CALCULATIONS; COMPOSITION; KINEMATICS; MOIRE FRINGES; SUBSTRATES; TRANSMISSION ELECTRON MICROSCOPY;

SEMICONDUCTOR ISLANDS;

MICROSCOPIC EXAMINATION;

ANALYTIC METHOD; ARTICLE; CHEMICAL ANALYSIS; CHEMICAL COMPOSITION; IMAGE ANALYSIS; KINEMATICS; MATHEMATICAL ANALYSIS; SEMICONDUCTOR; STAINING; TRANSMISSION ELECTRON MICROSCOPY;

EID: 0036837521     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(02)00156-0     Document Type: Article

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