Reversible logic-based concurrently testable latches for molecular QCA

IEEE Transactions on Nanotechnology

Volumn 9, Issue 1, 2010, Pages 62-69

  Thapliyal, Himanshu ^a   Ranganathan, Nagarajan ^a  

^a UNIVERSITY OF SOUTH FLORIDA   (United States)

Author keywords

Concurrent testing; Conservative reversible logic; Sequential circuits

Indexed keywords

CONCURRENT TESTING; CONSERVATIVE LOGIC; CONSERVATIVE REVERSIBLE LOGIC; D-LATCH; ERROR RATE; FAULT PATTERNS; FREDKIN GATE; INPUT VECTOR; ONE-TO-ONE MAPPINGS; OUTPUT VECTORS; QUANTUM-DOT CELLULAR AUTOMATA; REVERSIBLE CIRCUITS; REVERSIBLE LOGIC; TRANSIENT FAULTS;

CELLULAR AUTOMATA; FORMAL LOGIC; LOGIC GATES; PATTERN RECOGNITION SYSTEMS; SEMICONDUCTOR QUANTUM DOTS; SEQUENTIAL CIRCUITS;

FLIP FLOP CIRCUITS;

EID: 75449114443     PISSN: 1536125X     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNANO.2009.2025038     Document Type: Article

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