Analysis of missing and additional cell defects in sequential quantum-dot cellular automata

Integration, the VLSI Journal

Volumn 40, Issue 4, 2007, Pages 503-515

  Huang, J ^a   Momenzadeh, M ^a   Lombardi, F ^a  

^a Northeastern University   (United States)

Author keywords

Defect; Emerging technology; QCA; Sequential circuit

Indexed keywords

AUTOMATA THEORY; FLIP FLOP CIRCUITS; SEQUENTIAL CIRCUITS; SWITCHING SYSTEMS; TECHNOLOGY TRANSFER;

CIRCUIT LEVEL ANALYSIS; EMERGING TECHNOLOGY; QUANTUM-DOT CELLULAR AUTOMATA (QCA);

SEMICONDUCTOR QUANTUM DOTS;

EID: 34249055018     PISSN: 01679260     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.vlsi.2006.08.001     Document Type: Article

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